VK-X Series Confocal Microscope vs White Light Interferometer Comparison

This document compares the advantages and disadvantages of laser scanning confocal microscopes and white light interference systems for non-contact, nano-level surface profiling. It details the measurement principles of the VK-X series confocal microscope, including its confocal pinhole system, RPD algorithm, and Double Scan feature, alongside the interference-based operation of white light interferometers.